TOYOTA 丰田汽车多媒体信息设备试验项目
1. Scope ·
This standard covers the bench test method for reliability of automobile multimedia functional components. This standard applies to all multimedia equipment installed with microcomputers.
2. Definitions
The main definitions used in this standard is as follows.
Components and their entire systems to be subject to the test.
Example:
Audio Head Unit (hereinafter referred to as "audio H/U" or "H/U")
Audio Visual Navigation (hereinafter referred to as "AVN")
Audio Unit incorporates audio and visual systems (hereinafter referred to as "AVX")
Electro Multi Vision {hereinafter referred to as "EMV")
Electro M lti Vision Navigation (hereinafter referred to as "EMVN")
Navigation computer {hereinafter referred to as "navigation ECU") Audio amplifier
Data communication module (hereinafter referred to as "DCM")
Rear seat display, seatback display (hereinafter referred to as "Rr Disp")
Digital TV tuner (hereinafter referred to as "DTV tuner")
Digital radio tuner
Rear seat separation box or rear seat entertainment {hereinafter referred to as "RSE ECU")
Display audio (hereinafter referred to as "DA")
Back up 1battery (hereinafter referred to as "BUB")
Blu-ray disc (hereinafter referred to as "BD")
External media (referring to CD, MD, DVD, BD, tape, USB memory, ipod and the like.)
TSC7562G: Bench test method for reliability of multimedia functional components
Classification | Test item | Section for test method | Number of samples |
Initial characteristics test | Appearance Operation Performance | 6.1.1 6.1.2- 6.1.3 |
All |
Temperature/voltage composite characteristics test |
6.2 |
3 | |
Environment resistance test | High-temperature storage test | 6.3 | 3 |
Low-temperature storage test | 6.4 | 3 | |
Thermal shock test | 6.5 | 3 | |
Solder life test | 6.6 | See TSC7010G. | |
Migration test | 6.7 | See TSC7019G | |
Dew condensation test | 6.8 | 3 | |
Temperature/humidity cycle test | 6.9 | 3 | |
Dust resistance test | 6.10.1 6.10.2 |
3 for each | |
Shock test for unpackac::ted eQuipment | 6.11 | 3 | |
Dropping shock test | 6.12 | 3 | |
Weight-dropping impact test (1) | 6.13 | 3 | |
Weight-dropping Impact test (2) | 6.14 | 3 | |
Shock durability test | 6.15 | 3 | |
Whisker test | 6.16 | See TSC7038G. | |
Sulfur resistance test |
6..17 | See TSC7036G and TSM1719G. | |
Durability test |
Normal temperature operation durability test |
6.18 | 3 (3 for every illumination condition when equipment has illumination functions) |
High-temperature oj)_eration test | 6.19 | 3 | |
Low-temperature operation test | 6.20 | 3 | |
High temperature and humidity operation test | 6.21 | 3 | |
Reduced pressure operation durability test | 6.22 | 3 | |
Resonance point detection test | 6.23.1 | 3 | |
Resonance point vibration durabili!Y test | 6.23.2 | 3 | |
Sweep vibration dl)rabilitv test | 6.23.3 | 3 | |
Operation durability test | 6.24 | 3 |
TSC7561G: Bench test method for electrical noise of multimedia equipment
Group | Test item | Test method | Number of samples |
Initial characteristics test | Appearance Operation Performance | 6.1.1 6.1.2- 6.1.3 |
All |
Electrical noise tests | Power supply voltage characteristics test | Section 6.2 | 1 |
Power supply voltage fluctuation test | Section 6.3 | 1 | |
Power supply voltage fluctuation test | Section 6.4 | 1 | |
Field decay test | Section 6.5 | 1 | |
Floating ground | Section 6.6 | 1 | |
Induction noise resistance | Section 6.7 | 1 | |
Load dumptest | Section 6.8 | 1 | |
Overvoltage test ' | Section 6.9 | 1 | |
Reversed polarity | Section 6.10 | 1 | |
Electrostatic discharge resistance test of equipment in operation |
Section 6.11.1 |
1 | |
Electrostatic discharge resistance test of equipment with power turn off |
Section 6.11.2 |
1 | |
Electromagnetic interference (EMI) test | Section 6.12 | 1 | |
Electromagnetic interference (radio noise) test |
Section 6.13 |
1 | |
Electromagnetic irradiation test for components subject to EMC regulations for electromagnetic compatibility |
Section 6.14 |
1 | |
Narrow band emission noise test for components subject to EMC regulations for electromagnetic compatibility |
Section 6.15 |
1 | |
Wide band emission noise test for components subject to EMC regulations for electromagnetic compatibility |
Section 6.16 |
1 | |
Electrical noise test for components subject toEMC regulations for electromagnetic compatibility |
Section 6.17 I |
1 | |
Test for pop noise on the bench when button pressed |
Section 6.18 |
1 | |
Extended test | Output terminal test | Section 6.19 | 1 |
Power supply voltage leakage test | Section 6.20 | 1 | |
Overvoltage breakdown test | Section 6.21 | 1 | |
Parasitic oscillation test | Section 6.22 | 1 |